Struct WearCheck 

pub(crate) struct WearCheck {
    last: Last,
}

Decides which failing blocks are worn and marks them bad.

A chip with active write protection fails every erase with EIO, just like a worn block. A failed block only counts as worn if the block tried right before or right after it worked. A second failure in a row is returned as an error. A protected chip loses at most one block.

Fields

last: Last

Implementations

impl WearCheck

pub(crate) fn worked(&mut self, flash: &dyn Flash) -> Result<(), DeviceError>

Records that the last tried block worked.

pub(crate) fn failed( &mut self, flash: &dyn Flash, block: u32, err: DeviceError, ) -> Result<(), DeviceError>

Records that block failed with err.

Returns Ok if the caller should go on with the next block.

pub(crate) fn finish(&mut self) -> Result<(), DeviceError>

Returns the error of the last failed block if no block confirmed it.

Trait Implementations

impl Debug for WearCheck

fn fmt(&self, f: &mut Formatter<'_>) -> Result

Formats the value using the given formatter.

impl Default for WearCheck

fn default() -> WearCheck

Returns the “default value” for a type.